- 2 functional tests: export_sqlite_to_flatfile, import_flatfile_to_sqlite with XEP-0203 delay timestamps for deterministic verification - 27 unit tests for database_export covering edge cases - Merge test/db-functional-tests: 12 DB persistence tests (test_history) - Group 2 rebalanced: 25 tests (23 base + 2 SQLite-only export/import) - #ifdef HAVE_SQLITE guards for export/import tests - prof_stop() helper in proftest.c - Makefile.am: source ordering cleanup, new test files added
30 lines
741 B
C
30 lines
741 B
C
#ifndef __H_PROFTEST
|
|
#define __H_PROFTEST
|
|
|
|
/*
|
|
* XDG paths are dynamic and generated per-test based on stub_port.
|
|
* Each test instance uses unique directories (./tests/functionaltests/files/{port}/xdg_*)
|
|
* to allow parallel test execution without file conflicts.
|
|
*/
|
|
extern char xdg_config_home[256];
|
|
extern char xdg_data_home[256];
|
|
|
|
extern int stub_port;
|
|
|
|
int init_prof_test(void **state);
|
|
int close_prof_test(void **state);
|
|
|
|
void prof_start(void);
|
|
void prof_stop(void);
|
|
void prof_connect(void);
|
|
void prof_connect_with_roster(const char *roster);
|
|
void prof_input(const char *input);
|
|
|
|
int prof_output_exact(const char *text);
|
|
int prof_output_regex(const char *text);
|
|
|
|
void prof_timeout(int timeout);
|
|
void prof_timeout_reset(void);
|
|
|
|
#endif
|